Monitoring the film formation during sputter deposition of vanadium carbide by in situ X-ray reflectivity measurements / von Marthe Kaufholz

By: Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Publisher: 2014Description: Online-RessourceGenre/Form: DDC classification:
  • 530
Online resources: Notes: Anmerkungen: Elektronische RessourceNote: Hinweis: Elektronische RessourceDissertation note: Karlsruhe, KIT, Diss., 2014 PPN: PPN: 818182199Package identifier: Produktsigel: GBV-ODiss
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