OCM 2015 - Optical Characterization of Materials : Conference Proceedings / ed. by Jürgen Beyerer ...

By:

Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung [aut]

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Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Publisher: Karlsruhe : KIT Scientific Publishing, 2015Description: Online-RessourceISBN:

9783731503187

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Additional physical formats: Erscheint auch als: OCM 2015 - optical characterization of materials. Druck-Ausgabe Karlsruhe : KIT Scientific Publishing, 2015. X, 285 S. | Erscheint auch als: OCM 2015 - 2nd International Conference on Optical Characterization of Materials. Druck-Ausgabe Karlsruhe : KIT Scientific Publ., 2015. VII, 279 S.DDC classification:

RVK: RVK: ZM 3500 | ZM 2000DOI: DOI: 10.5445/KSP/1000044906Online resources:

Volltext frei verfügbar

PPN: PPN: 820559520Package identifier: Produktsigel: H-GBV-FB-TIB | H-ZDB-104-KIT

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