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An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science / Sarah Fearn, Department of Materials, Imperial College, London SW7 2AZ

By: Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: IOP concise physicsPublisher: San Rafael, CA : Morgan & Claypool Publishers, [2015]Publisher: San Rafael, Calif. : Morgan & Claypool, [2015]Description: 1 Online-RessourceISBN:
  • 9781681740881
  • 9781681740881
Subject(s): Additional physical formats: 9781681740249 | Erscheint auch als: An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science. Druck-Ausgabe Version: 20151001. San Rafael, CA : Morgan & Claypool Publishers, 2015. 1 Band (verschiedene Seitenzählungen)DDC classification:
  • 523.1126
  • 543/.65 23
DOI: DOI: 10.1088/978-1-6817-4088-1Online resources: Summary: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.PPN: PPN: 837726042Package identifier: Produktsigel: ZDB-135-ICP | ZDB-135-IAL
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