Nanometrology using the transmission electron microscope / Vlad Stolojan, Advanced Technology Institute, Department of Electrical and Electronic Engineering, University of Surrey, Guildford, UK

Von:

Stolojan, Vlad [VerfasserIn]

Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: IOP concise physicsVerlag: San Rafael, CA : Morgan & Claypool Publishers, [2015]Auflage: Version: 20150901Beschreibung: 1 Online-RessourceISBN:

9781681741208
9781681741208

Schlagwörter:

Andere physische Formen: 9781681740560 | Erscheint auch als: 9781681740560 Druck-AusgabeDOI: DOI: 10.1088/978-1-6817-4120-8Online-Ressourcen:

Zugang im Netz des KIT

Zusammenfassung: The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and bio-molecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.PPN: PPN: 837726050Package identifier: Produktsigel: ZDB-135-ICP | ZDB-135-IAL

Exemplare ( 0 )

Dieser Titel hat keine Exemplare