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Nanometrology using the transmission electron microscope / Vlad Stolojan, Advanced Technology Institute, Department of Electrical and Electronic Engineering, University of Surrey, Guildford, UK

By: Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: IOP concise physicsPublisher: San Rafael, CA : Morgan & Claypool Publishers, [2015]Edition: Version: 20150901Description: 1 Online-RessourceISBN:
  • 9781681741208
  • 9781681741208
Subject(s): Additional physical formats: 9781681740560 | Erscheint auch als: 9781681740560 Druck-AusgabeDOI: DOI: 10.1088/978-1-6817-4120-8Online resources: Summary: The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and bio-molecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.PPN: PPN: 837726050Package identifier: Produktsigel: ZDB-135-ICP | ZDB-135-IAL
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