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Subaperture stitching interferometry : jigsaw puzzles in three-dimensional space / by Shanyong Chen, Shengyi Li, and Yifan Dai

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE spotlight ; vol. SL15Publisher: Bellingham, Washington : SPIE, May 2016Description: 1 Online-RessourceISBN:
  • 9781510602236
  • 9781510602243
  • 9781510602250
Subject(s): DDC classification:
  • 522.6 23
LOC classification:
  • QC367.3.I58
DOI: DOI: 10.1117/3.2242227Online resources: Summary: Wavefront interferometry is a standard solution when measuring optical surface error or wavefront aberrations. However, the lateral range of measurement is usually limited by the aperture of the interferometer. Subaperture stitching interferometry solves this problem by dividing the full aperture into a series of smaller, overlapping subapertures that are measured individually before being stitched back together. This Spotlight introduces the mathematical background, stitching algorithms, and subaperture lattice design for stitching interferometry with null subapertures, non-null subapertures, and near-null subapertures as applied to large flats, high-numerical-aperture spheres, and aspheresSummary: 1. Background: wavefront interferometry limited by both lateral and dynamic range of measurement -- 2. History: review of related work -- 3. Classification: different versions of subaperture stitching interferometry in various applications -- 4. Subaperture aberrations: methods for subaperture layout design: 4.1. Null subaperture layout design; 4.2. Aberrations of off-axis aspheric subapertures; 4.3. Non-null subaperture layout design; 4.4. Near-null optics; 4.5. Near-null subaperture layout design -- 5. Stitching: playing jigsaw puzzles in three-dimensional space: 5.1. Mathematical background; 5.2. Configuration space-based stitching model; 5.3. Iterative algorithm for subaperture stitching; 5.4. Special techniques dealing with a large number of subapertures -- 6. Uncertainty: how error sources affect the stitching: 6.1. Noise propagation during stitching; 6.2. Decoupling induced aberrations from surface error -- 7. Case studies: 7.1. Large flats; 7.2. Hyper-hemispheres; 7.3. Large convex spheres; 7.4. Large convex aspheres -- 8. Conclusions -- Acknowledgments -- ReferencesPPN: PPN: 861528158Package identifier: Produktsigel: ZDB-50-SPI
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