ESD protection methodologies : from component to system / Marise Bafleur, Fabrice Caignet and Nicolas Nolhier

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Bafleur, Marise [VerfasserIn]

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Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: Energy management in embedded systems setVerlag: London : ISTE Press, 2017Verlag: Oxford : Elsevier Ltd, 2017Beschreibung: 1 Online-RessourceISBN:

9780081011607

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Andere physische Formen: 9781785481222 LOC-Klassifikation:

QC585.7.E43

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Zusammenfassung: 2.3. Injection methods2.4. Failure analysis techniques; 2.5. Conclusion; 3. Protection Strategies Against ESD; 3.1. ESD design window; 3.2. Elementary protective components; 3.3. Discrete protections; 3.4. Challenges of the protection strategy at the system level; 3.5. Conclusion; 4. Modeling and Simulation Methods; 4.1. Physical simulation: TCAD approach to the optimization of elementary protections; 4.2. Electrical simulation: Compact modeling; 4.3. Behavioral simulation for prediction at the system level; 4.4. Conclusion; 5. Case StudiesZusammenfassung: 5.1. Case 1: Interaction between two types of protection5.2. Case 2: Detection of latent defaults caused by CDM stress; 5.3. Case 3: The impact of decoupling capacitors in propagation paths in a circuit; 5.4. Case 4: Functional failure linked to a decoupling capacitor; 5.5. Case 5: Fatal failure in an LIN circuit; 5.6. Case 6: Functional failure in a 16-bit microcontroller; 5.7. Conclusion; Conclusion; General rules for a global ESD protection strategy; Conclusion; Bibliography; Index; Back CoverZusammenfassung: Front Cover; ESD Protection Methodologies: From Component to System ; Copyright ; Contents; Foreword 1; Foreword 2; Preface; Introduction; I.1. Origin of electrostatic discharge; I.2. Impact on the electronics; I.3. ESD Protected Area or "EPA"; I.4. Conclusion; 1. ESD Standards: From Component to System; 1.1. Standards: From component to system; 1.2. Component level standards: HBM, MM, CDM, HMM; 1.3. Standards at the system level; 1.4. Conclusion; 2. Characterization Techniques; 2.1. Component level electrical characterization techniques; 2.2. System measurement methodsPPN: PPN: 898087112Package identifier: Produktsigel: ZDB-4-NLEBK

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