Degradation analysis and parameter extraction of organic semiconductor devices : investigation by means of complementary measurement techniques combined with numerical simulation / von Dipl.-Phys. Simon David Züfle

By: Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Publisher: Karlsruhe : KIT-Bibliothek, [2017]Description: 1 Online-Ressource (xix, 208 Seiten) : IllustrationenSubject(s): Genre/Form: DDC classification:
  • 621.3
DOI: DOI: 10.5445/IR/1000078129Online resources: Dissertation note: Dissertation - Karlsruhe, Karlsruher Institut für Technologie (KIT), 2017 PPN: PPN: 1010274031Package identifier: Produktsigel: GBV-ODiss
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