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Introduction to imaging spectrometers / William L. Wolfe

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Tutorial texts in optical engineering ; 25Publisher: Bellingham, Wash. <1000 20th St. Bellingham WA 98225-6705 USA> : SPIE, c1997Description: 1 online resource (xiii, 148 p. : ill.)ISBN:
  • 9780819478542
  • 0819422606
  • 9780819422606
Other title:
  • Imaging spectrometers
Subject(s): Additional physical formats: 0819422606. | 9780819422606. | Erscheint auch als: No title Druck-AusgabeDDC classification:
  • 621.361
  • 621.36/1 21
LOC classification:
  • QC373.S7
DOI: DOI: 10.1117/3.263530Online resources: Additional physical formats: Also available in print version.Summary: The increased interest in imaging spectroscopy has arisen largely for technical reasons. This Tutorial Text first reviews the required background in optics, radiometry, imaging, spectral sensing and focal plane arrays. Then the principles of these subjects are applied to several specific problems to illustrate the way in which such instruments can be designedSummary: 1. Introduction -- The Scheme of This Text -- The Future -- References and BibliographySummary: 10. Grating spectrometers -- Diffraction Theory -- Geometric Layout -- Resolution and Resolving Power -- Throughput -- Blazing Rulings -- OperationSummary: 11. Michelson interferometer spectrometers -- Two-Beam Interference -- Interference in the Michelson Interferometer -- The Twyman-Green Interferometer -- The Fourier Transform Spectrometer -- Throughput and SensitivitySummary: 12. An imaging Fourier transform spectrometer -- Monochromatic Operation -- Field OperationSummary: 13. Fabry-Perot interferometer spectrometers -- Description -- Spectral Transmission -- Resolving Power, Throughput, and Free Spectral Range -- The Fabry-Perot Imaging SpectrometerSummary: 14. A challenging application -- Requirements -- The (Up)Front-Filter Approach -- The Rear (FPA) Filter Approach -- The Multiple-Lens Filter Approach -- The Acousto-Optic Filter -- The Grating Approach -- The FTS Approach -- Sensitivity CalculationsSummary: 15. A satellite spectrometer -- Requirements -- Analysis -- Another Way to CalculateSummary: 16. A Mars Rover experiment -- Requirements Definitions -- The Martian Environment -- Optical Properties of (Martian?) Minerals -- The Candidate Imaging Spectrometers -- Two-Dimensional Array Systems -- Possible ImprovementsSummary: 17. Some trade-offs -- General Considerations -- Optical Efficiency -- Bandwidth -- Sensitivity -- ExamplesSummary: 18. Other examples -- The Westinghouse AOTF System -- HYDICE -- TRW DevicesSummary: 2. Optics overview -- Photons, Waves, and Rays -- The Detection of Radiation -- Interference -- Wavefronts, Normals, Beams, and Rays -- Refractive Index -- The Laws of Reflection and Refraction -- Total Internal Reflection -- Diffraction -- Geometric Optics and Optical Design -- The Idealized Thin Lens -- The Lens Maker's Equation -- Aberrations -- Bending the LensSummary: 3. Radiometry review -- Definitions of Important Radiometric Quantities -- Radiative Transfer -- Solid Angle and Speed -- Stops and PupilsSummary: 4. Spectrometer specifications -- Spectral Variables -- Resolution -- Resolving PowerSummary: 5. Imaging introduction -- The Field of View -- Scanners -- Strip Mappers -- Pushbroom Scanners -- Whiskbroom ScannersSummary: 6. Detector descriptions -- Descriptors -- Properties of Elemental Detectors -- Properties of Detector Arrays -- Fundamental LimitsSummary: 7. System sensitivity -- Specification -- Charge-Collecting Detectors -- Summary of Figures of MeritSummary: 8. Filter phenomena -- Types of Filters -- One-Layer Filters -- Multilayer Filters -- Circular and Linear Variable Filters -- Fabry-Perot Filters -- Acousto-Optical FiltersSummary: 9. Prism spectrometers -- Prism Deviation -- Minimum Deviation -- Geometric Layout -- Resolution and Resolving Power -- Throughput -- An ExampleSummary: Appendix to Chapter 2, Optics operations -- Derivation of the Wave Equation from Maxwell's Equations -- Representation of Fields -- The Poynting Vector -- Derivation of Snell's Law -- Interference -- Diffraction -- The Thin Lens -- Refraction at a Spherical Surface -- The Aberrations -- Bending the Lens -- Appendix to Chapter 6, Detectors -- The Signal -- The Noise -- The Noises -- Expressions for the Limiting Specific Detectivities -- Appendix to Chapter 9, Prisms -- Throughput -- Slit Sizes and Resolution -- Deviation -- Dispersion -- Some Mounting Arrangements -- Appendix to Chapter 10, Gratings -- The Grating Diffraction Pattern -- The Grating Equation -- Resolving Power -- Free Spectral Range -- Some Mounting Arrangements -- Appendix to Chapter 12, FTS foundations -- Resolution -- Resolving Power -- Sensitivity -- ApodizationPublication frequency: Erscheinungsweise: 1. Introduction -- The Scheme of This Text -- The Future -- References and BibliographyPPN: PPN: 101818919XPackage identifier: Produktsigel: ZDB-50-SPI
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