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Fundamentals of polarimetric remote sensing / John R. Schott

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Tutorial texts in optical engineering ; 81Publisher: Bellingham, Wash. <1000 20th St. Bellingham WA 98225-6705 USA> : SPIE, c2009Description: 1 online resource (xvii, 244 p. : ill.)ISBN:
  • 9780819478764
  • 0819475343
  • 9780819475343
Subject(s): Additional physical formats: 0819475343. | 9780819475343. | Erscheint auch als: No title Druck-AusgabeDDC classification:
  • 621.3678
  • 621.36/78 22
LOC classification:
  • G70.4
DOI: DOI: 10.1117/3.817304Online resources: Additional physical formats: Also available in print.Summary: This text is for those who need an introduction to polarimetric signals to begin working in the field of polarimetric remote sensing, particularly where the contrast between manmade objects and natural backgrounds are the subjects of interest. The book takes a systems approach to the physical processes involved with formation, collection, and analysis of polarimetric remote sensing data in the visible through longwave infrared. (pBRDF) is then introduced as a way to characterize the reflective and emissive polarimetric behavior of materials. With Dr. Schott's text, you will gain an introduction to polarimetric remote sensing, an appreciation of its issues, and the tools to begin to work in the fieldSummary: 1. Introduction. 1.1. Scope -- 1.2. Perspective on the field -- 1.3. Structure of the book -- ReferencesSummary: 10. Measurements and modeling of the pBRDF of materials. 10.1. Polarimetric BRDF measurement approach -- 10.2. Incorporation of pBRDF models in synthetic scene generation models -- 10.3. End-to-end passive polarimetric scene simulation -- ReferencesSummary: 11. Longwave infrared pBRDF principles. 11.1. Background on polarimetric remote sensing in the thermal infrared -- 11.2. Applications of polarimetric infrared imaging -- 11.3. Polarized BRDF and emissivity model -- 11.4. Polarized emissivity -- ReferencesSummary: 12. LWIR pBRDF measurements and modeling. 12.1. Measurement of polarized emissivity and pBRDF estimation -- 12.2. Thermal infrared polarimetric scene simulation -- 12.3. Closing thoughts -- References -- IndexSummary: 2. Review of radiometry. 2.1. Radiometric terms -- ReferencesSummary: 3. The wave nature of EM energy and an introduction of the polarization ellipse. 3.1. Wave nature of EM energy -- 3.2. The polarization ellipse -- 3.3. Special (degenerate) forms of the polarization ellipse -- ReferencesSummary: 4. Representation of the polarimetric state of a beam. 4.1. The stokes parameters -- 4.2. Stokes vector representation -- 4.3. Methods to characterize and interpret stokes vectors -- 4.4. Parameters of the polarization ellipse and the poincaré sphere -- ReferencesSummary: 5. Polarimetric interactions: reflection and transmission. 5.1. Fresnel specular reflection -- 5.2. Polarized transmission and polarizing materials -- 5.3 The Mueller matrix: polarimetric energy-matter interactions -- ReferencesSummary: 6. Polarimetric bidirectional reflectance distribution functions (pBRDF). 6.1. Bidirectional reflectance distribution functions -- 6.2. Polarimetric bidirectional reflectance distribution functions (pBRDF) -- 6.3. Reflectance variability or texture -- 6.4. BRDF measurement -- 6.5. BRDF models -- 6.6. Summary of pBRDF concepts -- ReferencesSummary: 7. Polarized form of the governing equation including atmospheric scattering terms. 7.1. Governing polarized radiance equation -- 7.2. Atmospheric scattering and the polarized state of the terms in the governing equation -- 7.3. Predicting the polarimetric radiance at the sensor -- References -- Color Plate SectionSummary: 8. Sensors for measuring the polarized state of a beam. 8.1. Sensing of polarization contrast -- 8.2. Generalized stokes vector polarimeters -- 8.3. Polarimetric imaging sensors -- 8.4. Issues related to polarimetric imaging sensors -- ReferencesSummary: 9. Processing and display algorithms. 9.1. Display of polarimetric images -- 9.2. Data processing and analysis -- ReferencesPublication frequency: Erscheinungsweise: 1. Introduction. 1.1. Scope -- 1.2. Perspective on the field -- 1.3. Structure of the book -- ReferencesPPN: PPN: 1018189467Package identifier: Produktsigel: ZDB-50-SPI | ZDB-50-SPI
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