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Introduction to optical testing / Joseph M. Geary

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Tutorial texts in optical engineering ; 15Publisher: Bellingham, Wash. <1000 20th St. Bellingham WA 98225-6705 USA> : SPIE, 1993Description: 1 online resource (xii, 149 p. : ill.)ISBN:
  • 9780819480996
  • 9780819413772
Subject(s): Additional physical formats: 0819413771. | 9780819413772. | Erscheint auch als: No title Druck-AusgabeDDC classification:
  • 681.40287
  • 681/.4/0287 20
LOC classification:
  • TS514
DOI: DOI: 10.1117/3.147225Online resources: Additional physical formats: Also available in print version.Summary: This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrationsSummary: Chapter 4. Wavefront sensors. 4.1. Introduction; 4.2. Principles of operation; 4.3. Direct measure of W(x,y): point diffraction interferometer; 4.4. Measures of differential wavefront (dW); 4.5. Measures of transverse ray error (T); 4.6. References -- Chapter 5. General light beam measurements. 5.1. Introduction; 5.2. Power-related measurements; 5.3. Color; 5.4. Coherence measurements; 5.5. Polarization; 5.6. Directionality (pointing): beam tilt sensing; 5.7. References -- Chapter 6. Component measurements. 6.1. Introduction; 6.2. Radius of curvature; 6.3. Refractive index; 6.4. Spectral transmission; 6.5. Collimation; 6.6. Surface roughness; 6.7. Light scattering; 6.8. Ellipsometry; 6.9. Instruments for (black and white) photographic film; 6.10. Extended source brightness (radiance); 6.11. References -- IndexSummary: Preface -- Chapter 1. Optical bench measurements on imaging systems. 1.1. Introduction; 1.2. Effective focal length; 1.3. f-number; 1.4. Axial color; 1.5. Field curvature and distortion; 1.6. Transmission; 1.7. Relative illumination falloff; 1.8. Veiling glare; 1.9. Thermal behavior; 1.10. References -- Appendix 1.1. Basic geometrical optics -- Appendix 1.2. Relative illumination falloff -- Chapter 2. Aberration and resolution measurements. 2.1. Introduction; 2.2. Spherical aberration; 2.3. Astigmatism; 2.4. Coma; 2.5. Image resolution; 2.6. Modulation transfer function tests; 2.7. References -- Chapter 3. Interferometric testing of optical systems. 3.1. Introduction; 3.2. Mathematical description of aberrations; 3.3. Fizeau interferometer; 3.4. Analyzing an interferogram; 3.5. Testing a lens; 3.6. Retrace error; 3.7. Collecting and handling data; 3.8. Environmental constraints; 3.9. Mounting; 3.10. References -- Appendix 3.1. Testing configurations using a Fizeau interferometerPPN: PPN: 1018189726Package identifier: Produktsigel: ZDB-50-SPI
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