Field guide to microscopy / Tomasz S. Tkaczyk

Von:

Tkaczyk, Tomasz S [aut]

Mitwirkende(r):

Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: SPIE field guides ; 13Verlag: Bellingham, Wash. <1000 20th St. Bellingham WA 98225-6705 USA> : SPIE, c2010Beschreibung: 1 online resource (xv, 138 p. : ill.)ISBN:

9780819478917
9780819472465

Schlagwörter:

Microscopy

Andere physische Formen: 0819472468. | 9780819472465. | Available in another form: Kein Titel DDC-Klassifikation:

502.82
502.8/2 22

LOC-Klassifikation:

QH205.2

DOI: DOI: 10.1117/3.798239Online-Ressourcen:

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Andere physische Formen: Also available in print version.Zusammenfassung: This guide provides extensive coverage of microscopic imaging principles. After reviewing the main principles of image formation, diffraction, interference, and polarization used in microscopy, this guide describes the most widely applied microscope configurations and applications. It also covers major system components, including light sources, illumination layouts, microscope optics, and image detection electronics. This guide also provides a comprehensive overview of microscopy techniques, including bright field and dark field imaging, contrast enhancement methods (such as phase and amplitude contrast), DIC, polarization, and fluorescence microscopy. In addition, it describes scanning techniques (such as confocal and multiphoton imaging points); new trends in super-resolution methods (such as 4Pi microscopy, STED, STORM, and structured illumination); and array microscopy, CARS, and SPIMZusammenfassung: Basics concepts -- Nature of light -- The spectrum of microscopy -- Wave equations -- Wavefront propagation -- Optical path length (OPL) -- Laws of reflection and refraction -- Total internal reflection -- Evanescent wave in total internal reflection -- Propagation of light in anisotropic media -- Polarization of light and polarization states -- Coherence and monochromatic light -- Interference -- Contrast vs spatial and temporal coherence -- Contrast of fringes (polarization and amplitude ratio) -- Multiple wave interference -- Interferometers -- Diffraction -- Diffraction grating -- Useful definitions from geometrical optics -- Image formation -- Magnification -- Stops and rays in an optical system -- Aberrations -- Chromatic aberrations -- Spherical aberration and coma -- Astigmatism, field curvature, and distortion -- Performance metrics -- Microscope construction -- The compound microscope -- The eye -- Upright and inverted microscopes -- The finite tube length microscope -- Infinity-corrected systems -- Telecentricity of a microscope -- Magnification of a microscope -- Numerical aperture -- Resolution limit -- Useful magnification -- Depth of field and depth of focus -- Magnification and frequency vs depth of field -- Köhler illumination -- Alignment of Köhler illumination -- Critical illumination -- Stereo microscopes -- Eyepieces -- Nomenclature and marking of objectives -- Objective designs -- Special objectives and features -- Special lens components -- Cover glass and immersion -- Common light sources for microscopy -- LED light sources -- Filters -- Polarizers and polarization prisms -- Specialized techniques -- Amplitude and phase objects -- The selection of a microscopy technique -- Image comparison -- Phase contrast -- Visibility in phase contrast -- The phase contrast microscope -- Characteristic features of phase contrast -- Amplitude contrast -- Oblique illumination -- Modulation contrast -- Hoffman contrast -- Dark field microscopy -- Optical staining : Rheinberg illumination -- Optical staining : dispersion staining -- Shearing interferometry : the basis for DIC -- DIC microscope design -- Appearance of DIC images -- Reflectance DIC -- Polarization microscopy -- Images obtained with polarization microscopes -- Compensators -- Confocal microscopy -- Scanning approaches -- Images from a confocal microscope -- Fluorescence -- Configuration of a fluorescence microscope -- Images from fluorescence microscopy -- Properties of fluorophores -- Single vs multi-photon excitation -- Light sources for scanning microscopy -- Practical considerations in LSM -- Interference microscopy -- Optical coherence tomography/microscopy -- Optical profiling techniques -- Optical profilometry : system design -- Phase-shifting algorithms -- Resolution enhancement techniques -- Structured illumination : axial sectioning -- Structured illumination : resolution -- Enhancement -- TIRF microscopy -- Solid immersion -- Stimulated emission depletion -- STORM -- 4Pi microscopy -- The limits of light microscopy -- Other special techniques -- Raman and CARS microscopy -- SPIM -- Array microscopy -- Digital microscopy and CCD detectors -- Digital microscopy -- Principles of CCD operation -- CCD architectures -- CCD noise -- Signal-to-noise ratio and the digitization of CCD -- CCD sampling -- Equation summary -- Bibliography -- IndexPPN: PPN: 1018189882Package identifier: Produktsigel: ZDB-50-SPI

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