Windowed fringe pattern analysis / Qian Kemao

By:

Kemao, Qian [aut]

Contributor(s):

Society of Photo-optical Instrumentation Engineers [Verlag]

Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE press monograph ; PM239Publisher: Bellingham, Washington <1000 20th St. Bellingham WA 98225-6705 USA> : SPIE Press, 2013Description: 1 online resource (284 pages) : illustrationsISBN:

9780819496430
9780819496416

Subject(s):

Additional physical formats: 9780819496416. | Print version: No title DDC classification:

515.2433
515/.2433

LOC classification:

TA1637

DOI: DOI: 10.1117/3.1002080Online resources:

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Additional physical formats: Also available in print version.Summary: Fringe patterns can be formed coherently using various interferometers and incoherently using the moirâe technique. They can also be designed in fringe projection profilometry. All of these techniques are useful for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. This book addresses the challenges and solutions involved in this process. Both theoretical analysis and algorithm development will be covered to facilitate the work of both researchers and engineers. The information herein may also serve as a specialized subject for students of optical and/or computer engineeringSummary: Preface -- Glossary of terms and acronyms -- 1. Introduction -- 2. Windowed Fourier ridges for exponential phase fields -- 3. Windowed Fourier filtering for exponential phase fields -- 4. Quality-guided phase unwrapping and refinement -- 5. Carrier fringe pattern demodulation -- 6. Denoising a single closed fringe pattern -- 7. Demodulating a single closed fringe pattern -- 8. Extracting dynamic phase from a sequence of fringe patterns -- 9. Algorithm acceleration using parallel computingPPN: PPN: 1018190775Package identifier: Produktsigel: ZDB-50-SPI

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