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Progress in Nanoscale Characterization and Manipulation / edited by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai

Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Springer Tracts in Modern Physics ; 272 | SpringerLink BücherPublisher: Singapore : Springer Singapore, 2018Description: Online-Ressource (VII, 508 p. 333 illus., 26 illus. in color, online resource)ISBN:
  • 9789811304545
Subject(s): Additional physical formats: 9789811304538 | Erscheint auch als: Progress in nanoscale characterization and manipulation. Druck-Ausgabe. Beijing : Peking University Press, 2018. vii, 508 SeitenDDC classification:
  • 620.5
RVK: RVK: UD 9310LOC classification:
  • QC176.8.N35 T174.7
  • QC176.8.N35
  • T174.7
DOI: DOI: 10.1007/978-981-13-0454-5Online resources: Summary: This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the fieldSummary: Electron/Ion Optics -- Scanning Electron Microscopy -- Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy (STEM) -- Spectroscopy -- Aberration Corrected Transmission Electron Microscopy and Its Applications -- In situ TEM: Theory and Applications -- Helium Ion MicroscopyPPN: PPN: 1030105030Package identifier: Produktsigel: ZDB-2-PHA | ZDB-2-SEB | ZDB-2-SXP
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Reproduktion. (Springer eBook Collection. Physics and Astronomy)

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