Dimensional Optical Metrology and Inspection for Practical Applications VII : 17-19 April 2018, Orlando, Florida, United States / Kevin G. Harding, Song Zhang (editors) ; sponsored and published by: SPIE

By:

(7. : Dimensional Optical Metrology and Inspection for Practical Applications (Veranstaltung) (7. : 2018 : Orlando, Fla.) [VerfasserIn]

Contributor(s):

Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 10667Publisher: Bellingham, Washington, USA : SPIE, [2018]Description: 1 Online-Ressource : IllustrationenISBN:

9781510618466

Other title:

SPIE Commercial Scientific Sensing Imaging Defense DCS

Subject(s):

Optische Messtechnik

Genre/Form:

Konferenzschrift

Additional physical formats: 9781510618459 Online resources:

PPN: PPN: 1031018301Package identifier: Produktsigel: ZDB-1-SPIE

Holdings ( 0 )

No physical items for this record

Print
Cite
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Karlsruher Virtueller Katalog Bibliotheksportal Karlsruhe Google Scholar Andere Bibliotheken (WorldCat)