A Parametric Approach to Nonparametric Statistics / by Mayer Alvo, Philip L. H. Yu

Von:

Alvo, Mayer [VerfasserIn]

Mitwirkende(r):

Yu, Philip L. H [VerfasserIn]

Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: Springer Series in the Data Sciences | Springer eBook Collection | SpringerLink BücherVerlag: Cham : Springer International Publishing, 2018Beschreibung: Online-Ressource (XIV, 279 p. 15 illus. in color, online resource)ISBN:

9783319941530

Schlagwörter:

Andere physische Formen: 9783319941523 | Erscheint auch als: 9783319941523 Druck-Ausgabe | Erscheint auch als: A parametric approach to nonparametric statistics. Druck-Ausgabe Cham : Springer Nature, 2018. xiv, 279 SeitenDDC-Klassifikation:

519.2

MSC: MSC: *62-01 | 62Gxx | 62Fxx | 62N02LOC-Klassifikation:

QA273.A1-274.9 QA274-274.9
QA273.A1-274.9
QA274-274.9

DOI: DOI: 10.1007/978-3-319-94153-0Online-Ressourcen:

Zusammenfassung: This book demonstrates that nonparametric statistics can be taught from a parametric point of view. As a result, one can exploit various parametric tools such as the use of the likelihood function, penalized likelihood and score functions to not only derive well-known tests but to also go beyond and make use of Bayesian methods to analyze ranking data. The book bridges the gap between parametric and nonparametric statistics and presents the best practices of the former while enjoying the robustness properties of the latter. This book can be used in a graduate course in nonparametrics, with parts being accessible to senior undergraduates. In addition, the book will be of wide interest to statisticians and researchers in applied fieldsZusammenfassung: I. Introduction and Fundamentals -- Introduction -- Fundamental Concepts in Parametric Inference -- II. Modern Nonparametric Statistical Methods -- Smooth Goodness of Fit Tests -- One-Sample and Two-Sample Problems -- Multi-Sample Problems -- Tests for Trend and Association -- Optimal Rank Tests -- Efficiency -- III. Selected Applications -- Multiple Change-Point Problems -- Bayesian Models for Ranking Data -- Analysis of Censored Data -- A. Description of Data SetsPPN: PPN: 1036398684Package identifier: Produktsigel: ZDB-2-SEB | ZDB-2-SMA | ZDB-2-SXMS

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