Medical Imaging 2017: Computer-Aided Diagnosis : 13-16 February 2017, Orlando, Florida, United States / Samuel G. Armato III, Nicholas A. Petrick (editors) ; sponsored by: SPIE
Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Progress in biomedical optics and imaging ; vol. 18, no. 48 | SPIE. Proceedings of SPIE ; volume 10134Publisher: Bellingham, Washington, USA : SPIE, [2017]Description: 1 Online-Ressource : IllustrationenISBN:- 9781510607132
- SPIE Conference
- Computer-Aided Diagnosis
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