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Dimensional Optical Metrology and Inspection for Practical Applications VI : 13 April 2017, Anaheim, California, United States / Kevin G. Harding, Song Zhang (editors) ; sponsored and published by: SPIE

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 10220Publisher: Bellingham, Washington, USA : SPIE, [2017]Description: 1 Online-Ressource : IllustrationenISBN:
  • 9781510609426
Other title:
  • SPIE Commercial Scientific Sensing Imaging Defense DCS
Subject(s): Genre/Form: Additional physical formats: 9781510609419 | Erscheint auch als: Dimensional optical metrology and inspection for practical applications VI. Druck-Ausgabe Bellingham, Washington, USA : SPIE, 2017. circa 110 verschieden gezählte SeitenOnline resources: PPN: PPN: 1043588051Package identifier: Produktsigel: ZDB-1-SPIE
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