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Damage to VUV, EUV, and X-Ray Optics VI : 24-25 April 2017, Prague, Czech Republic / Libor Juha, Saša Bajt, Regina Soufli (editors) ; sponsored by: SPIE

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 10236Publisher: Bellingham, Washington, USA : SPIE, [2017]Description: 1 Online-Ressource : IllustrationenISBN:
  • 9781510609747
Other title:
  • SPIE Optoelectronics SPIE's International Symposium Prag
Subject(s): Genre/Form: Additional physical formats: 9781510609730 | Erscheint auch als: Damage to VUV, EUV, and X-Ray Optics VI. Druck-Ausgabe Bellingham, Washington, USA : SPIE, 2017. circa 60 verschieden gezählte SeitenOnline resources: PPN: PPN: 1043705740Package identifier: Produktsigel: ZDB-1-SPIE
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