Automated Visual Inspection and Machine Vision II : 29 June 2017, Munich, Germany / Jürgen Beyerer, Fernando Puente León (editors) ; sponsored by: SPIE ; cooperating organisations: European Optical Society, German Scientific Laser Society (Wissenschaftliche Gesellschaft Lasertechnik e.V.)

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(2. : Automated Visual Inspection and Machine Vision (Veranstaltung) (2. : 2017 : München) [VerfasserIn]

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Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 10334Publisher: Bellingham, Washington, USA : SPIE, [2017]Description: 1 Online-Ressource : IllustrationenISBN:

9781510611146

Other title:

SPIE Optical Metrology 23rd Twenty-third World Photonics Congress International Europe München

Genre/Form:

Konferenzschrift

Additional physical formats: 9781510611139 | Erscheint auch als: Automated Visual Inspection and Machine Vision II. Druck-Ausgabe Bellingham, Washington, USA : SPIE, 2017. circa 240 verschieden gezählte SeitenOnline resources:

PPN: PPN: 1043810242Package identifier: Produktsigel: ZDB-1-SPIE

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