X-Ray Nanoimaging: Instruments and Methods III : 7-8 August 2017, San Diego, California, United States / Barry Lai, Andrea Somogyi (editors) ; sponsored by: SPIE
Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE. Proceedings of SPIE ; volume 10389Publisher: Bellingham, Washington, USA : SPIE, [2017]Description: 1 Online-Ressource : IllustrationenISBN:- 9781510612365
- SPIE Optical Engineering Applications Optics Photonics
No physical items for this record