Label-free super-resolving microscopy with nanoparticles / by Omer Wagner and Zeev Zalevsky

By:

Wagner, Omer [VerfasserIn]

Contributor(s):

Zalevsky, Zeev [VerfasserIn]

Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: SPIE spotlight ; vol. SL44Publisher: Bellingham, Washington, USA : SPIE Press, 2018Description: 1 Online-Ressource (v, 21 Seiten) : IllustrationenISBN:

9781510623040
9781510623057
9781510623064

Additional physical formats: 9781510623057 DOI: DOI: 10.1117/3.2514861Online resources:

Zugang im Netz des KIT
Zugang im Netz des KIT

PPN: PPN: 1046190415Package identifier: Produktsigel: ZDB-50-SPI

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