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Spectroscopic Ellipsometry for Photovoltaics : Volume 1: Fundamental Principles and Solar Cell Characterization / edited by Hiroyuki Fujiwara, Robert W. Collins

Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Springer Series in Optical Sciences ; 212 | SpringerLink BücherPublisher: Cham : Springer International Publishing, 2018Description: Online-Ressource (XX, 594 p. 336 illus., 266 illus. in color, online resource)ISBN:
  • 9783319753775
Subject(s): Additional physical formats: 9783319753751 | 9783319753768 | Erscheint auch als: Spectroscopic ellipsometry for photovoltaics ; Volume 1: Fundamental principles and solar cell characterization. Druck-Ausgabe. Cham, Switzerland : Springer, 2018. xx, 594 Seiten | Erscheint auch als: 978-3-319-75375-1 Druck-Ausgabe | Printed edition: 9783319753751 | Printed edition: 9783319753768 DDC classification:
  • 621.36
LOC classification:
  • TA1671-1707 TA1501-1820
  • TA1671-1707
  • TA1501-1820
DOI: DOI: 10.1007/978-3-319-75377-5Online resources: Summary: This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layersSummary: Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide LayersPPN: PPN: 1048366367Package identifier: Produktsigel: ZDB-2-PHA | ZDB-2-SEB | ZDB-2-SXP
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