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Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials / by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert

By: Contributor(s): Resource type: Ressourcentyp: Buch (Online)Book (Online)Language: English Series: Springer Series in Advanced Microelectronics ; 10 | SpringerLink BücherPublisher: Cham : Springer International Publishing, 2018Edition: 3rd ed. 2018Description: Online-Ressource (XXI, 321 p. 126 illus., 68 illus. in color, online resource)ISBN:
  • 9783319998251
Subject(s): Additional physical formats: 9783319998244 | 9783319998268 | Erscheint auch als: 978-3-319-99824-4 Druck-Ausgabe | Printed edition: 9783319998244 | Printed edition: 9783319998268 DDC classification:
  • 621.36
LOC classification:
  • TA1671-1707 TA1501-1820
  • TA1671-1707
  • TA1501-1820
DOI: DOI: 10.1007/978-3-319-99825-1Online resources: Summary: This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also includedSummary: Introduction -- Physical and Technical Basics -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and OutlookPPN: PPN: 1048368181Package identifier: Produktsigel: ZDB-2-PHA | ZDB-2-SEB | ZDB-2-SXP
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