VLSI Design and Test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers / edited by S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh

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Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: Communications in Computer and Information Science ; 892 | Springer eBook Collection | SpringerLink BücherVerlag: Singapore : Springer Singapore, 2019Beschreibung: Online-Ressource (XVIII, 722 p. 711 illus., 324 illus. in color, online resource)ISBN:

9789811359507

Schlagwörter:

Andere physische Formen: 9789811359491 | 9789811359514 | Printed edition: 9789811359491 | Printed edition: 9789811359514 DDC-Klassifikation:

LOC-Klassifikation:

QA75.5-76.95 TK7885-7895
QA75.5-76.95
TK7885-7895

DOI: DOI: 10.1007/978-981-13-5950-7Online-Ressourcen:

Zusammenfassung: This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfacesZusammenfassung: Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfacesPPN: PPN: 104836853XPackage identifier: Produktsigel: ZDB-2-SCS | ZDB-2-SEB | ZDB-2-SXCS

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