Modern developments in electron microscopy / ed. by Benjamin M. Siegel

Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: New York [u.a.] : Acad. Pr., 1964Description: XIII, 432 S. : Ill., graph. DarstSubject(s): DDC classification:
  • 578.15
RVK: RVK: WC 3100 | UH 6300Call number: Grundsignatur: 65 A 713PPN: PPN: 1070803189
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