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Characterization of crystal growth defects by X-ray methods : proceedings / ed. by Brian K. Tanner ...
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: NATO. NATO advanced study institutes series / B ; 63Publisher: New York [u.a.] : Plenum Press, 1980Description: XXVI, 589 S. : Ill., graph. DarstISBN:- 0306406284
- 548/.5
- 539.7/21
- QD921
| Item type | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
| Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | 81 E 40 | Available | 17129974 |
Total holds: 0