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The application of electron microscopy to materials science : proceedings of an international workshop, held in China, Gauonzhou, August 1988 / ed.: K. H. Kuo. Sponsored by the Chinese Academy of Sciences ..

Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: Diffusion and defect data / B ; 5Publisher: Vaduz : Trans Tech Publ., 1989Description: 209 S. : Ill., graph. DarstISBN:
  • 3908044014
Other title:
  • Nebent.: Focus electron microscopy
  • Focus electron microscopy
  • Electron microscopy
Subject(s): Genre/Form: DDC classification:
  • 541.3
RVK: RVK: UH 6300Action note:
  • 1
Call number: Grundsignatur: ZA 5367:B-5.1989PPN: PPN: 025151800
Holdings
Item type Home library Shelving location Call number Status Date due Barcode Item holds
Magazinbestand ausleihbar Bibliothek Campus Süd Geschlossenes Magazin ZA 5367:B-5.1989 Available 50151586090
Total holds: 0

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