The application of electron microscopy to materials science : proceedings of an international workshop, held in China, Gauonzhou, August 1988 / ed.: K. H. Kuo. Sponsored by the Chinese Academy of Sciences ..
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: Diffusion and defect data / B ; 5Publisher: Vaduz : Trans Tech Publ., 1989Description: 209 S. : Ill., graph. DarstISBN:- 3908044014
- Nebent.: Focus electron microscopy
- Focus electron microscopy
- Electron microscopy
- 541.3
- 1
Item type | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|
Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | ZA 5367:B-5.1989 | Available | 50151586090 |
Total holds: 0
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