Testing and reliable design of CMOS circuits / by Niraj K. Jha and Sandip Kundu
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 88 : VLSI, computer architecture and digital signal processingPublisher: Dordrecht [u.a.] : Kluwer, 1990Description: XII, 231 S : ill ; 25 cmISBN:- 0792390563
- 621.39/732
- TK7871.99.M44
- 3
Item type | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|
Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | 90 A 1703 | Available | 46400913090 | |||
Institutsbestand | ITIV | IB-2517 | Not for loan |
Total holds: 0
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