Testing and reliable design of CMOS circuits / by Niraj K. Jha and Sandip Kundu

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Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 88 : VLSI, computer architecture and digital signal processingPublisher: Dordrecht [u.a.] : Kluwer, 1990Description: XII, 231 S : ill ; 25 cmISBN:

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RVK: RVK: ST 190LOC classification:

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Call number: Grundsignatur: 90 A 1703PPN: PPN: 025237691

Holdings
Item type	Home library	Shelving location	Call number	Status	Date due	Barcode	Item holds
Magazinbestand ausleihbar	Bibliothek Campus Süd	Geschlossenes Magazin	90 A 1703	Available		46400913090
Institutsbestand	ITIV		IB-2517	Not for loan

Total holds: 0

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