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Testing and reliable design of CMOS circuits / by Niraj K. Jha and Sandip Kundu

By: Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: Kluwer international series in engineering and computer science ; 88 : VLSI, computer architecture and digital signal processingPublisher: Dordrecht [u.a.] : Kluwer, 1990Description: XII, 231 S : ill ; 25 cmISBN:
  • 0792390563
Subject(s): DDC classification:
  • 621.39/732
RVK: RVK: ST 190LOC classification:
  • TK7871.99.M44
Action note:
  • 3
Call number: Grundsignatur: 90 A 1703PPN: PPN: 025237691
Holdings
Item type Home library Shelving location Call number Status Date due Barcode Item holds
Magazinbestand ausleihbar Bibliothek Campus Süd Geschlossenes Magazin 90 A 1703 Available 46400913090
Institutsbestand ITIV IB-2517 Not for loan
Total holds: 0

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