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Fundamentals of surface and thin film analysis / Leonard C. Feldman; James W. Mayer
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: New York, NY [u.a.] : North Holland, 1986Description: XVIII, 352 S. : zahlr. graph. DarstISBN:- 0444009892
- 530.4/1
| Item type | Home library | Collection | Shelving location | Call number | Copy number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|---|
| Magazinbestand ausleihbar | Bibliothek Campus Nord | Geschlossenes Magazin | 87 A 595 | ;b | Available | 53043757090 | ||||
| Freihandbestand Präsenznutzung | Fachbibliothek Physik | phys 8.70 | Bibliothek / frei aufgestellt | 87 A 595 | Not for loan | 23089824 |
Total holds: 0