Custom cover image
Custom cover image

Fundamentals of surface and thin film analysis / Leonard C. Feldman; James W. Mayer

By: Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Publisher: New York, NY [u.a.] : North Holland, 1986Description: XVIII, 352 S. : zahlr. graph. DarstISBN:
  • 0444009892
Subject(s): DDC classification:
  • 530.4/1
RVK: RVK: UP 7500Call number: Grundsignatur: 87 A 595PPN: PPN: 025296043
Holdings
Item type Home library Collection Shelving location Call number Copy number Status Date due Barcode Item holds
Magazinbestand ausleihbar Bibliothek Campus Nord Geschlossenes Magazin 87 A 595 ;b Available 53043757090
Freihandbestand Präsenznutzung Fachbibliothek Physik phys 8.70 Bibliothek / frei aufgestellt 87 A 595 Not for loan 23089824
Total holds: 0

Powered by Koha