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Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis / R. G. Wilson; F. A. Stevie; C. W. Magee
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: A Wiley-Interscience publicationPublisher: New York [u.a.] : Wiley, 1989Description: Getr. Zählung : graph. DarstISBN:- 0471519456
- 543.0873
- QD96.S43
| Item type | Home library | Collection | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|---|
| Freihandbestand ausleihbar | Bibliothek Campus Nord | chem 3.6 | Lesesaal CN | 2013 A 4660 | Available | 51465873090 |
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