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Conférence Internationale sur Ellipsométrie et Autres Méthodes Optiques pour l'Analyse des Surface et Films Minces, 7-10 juin 1983, Paris (France) = Ellipsometry and other optical methods for surface and thin film analysis
Resource type: Ressourcentyp: BuchBookLanguage: French, English Series: Journal de physique ; 44,Suppl.10Publisher: Les Ulis : Les Éd. de Physique, 1983Description: XVIII, 533 S : Ill., graph. DarstISBN:- 2902731698
- Ellipsometry and other optical methods for surface and thin film analysis
- Ellipsometry and other optical methods for surface and thin film analysis
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Call number: Grundsignatur: 84 A 624PPN: PPN: 013997688
| Item type | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
| Magazinbestand ausleihbar | Bibliothek Campus Süd | Geschlossenes Magazin | 84 A 624 | Available | 47991849090 |
Total holds: 0
Beitr. teilw. franz., teilw. engl