High resolution electron microscopy applied to chemical problems : Proceedings of a symposium held at the 182. National Meeting of the American Chemical Society, New York, NY, Aug. 25 - 26, 1981 / Ed. by LeRoy Eyring
Contributor(s): Resource type: Ressourcentyp: BuchBookLanguage: English Series: American Chemical Society. National Meeting of the American Chemical Society ; 182Publisher: Amsterdam : North-Holland, 1982Description: X, 239 SGenre/Form: Action note:- 1
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