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Testing static random access memories : defects, fault models and test patterns / by Said Hamdioui
Resource type: Ressourcentyp: BuchBookSeries: Frontiers in electronic testing ; 26Publisher: Boston, Mass. ; London : Kluwer Academic, 2004Description: XX, 221 SISBN:- 1402077521
- TK7895.M4
- 1
| Item type | Home library | Collection | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|---|
| Freihandbestand ausleihbar | Bibliothek Campus Süd | nach 8.24 | Lesesaal Technik (LST) | 2004 A 23200 | Available | 46691274090 |
Total holds: 0
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