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Particle characterization in technology. 1, Applications and microanalysis / ed. John Keith Beddow

Resource type: Ressourcentyp: BuchBookLanguage: English Set: Particle characterization in technology.Publisher: Boca Raton, Fla. : CRC Pr., 1984Description: 246 S. : Ill., graph. DarstISBN:
  • 0849357845
RVK: RVK: VN 7170Action note:
  • 1
Call number: Grundsignatur: 2014 E 20-1PPN: PPN: 146948708X
Holdings
Item type Home library Shelving location Call number Status Barcode
Magazinbestand ausleihbar Bibliothek Campus Nord Geschlossenes Magazin 2014 E 20-1 Available 51634038090
Total holds: 0

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