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Particle characterization in technology. 1, Applications and microanalysis / ed. John Keith Beddow
Resource type: Ressourcentyp: BuchBookLanguage: English Set: Particle characterization in technology.Publisher: Boca Raton, Fla. : CRC Pr., 1984Description: 246 S. : Ill., graph. DarstISBN:- 0849357845
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| Item type | Home library | Shelving location | Call number | Status | Barcode | |
|---|---|---|---|---|---|---|
| Magazinbestand ausleihbar | Bibliothek Campus Nord | Geschlossenes Magazin | 2014 E 20-1 | Available | 51634038090 |
Total holds: 0
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