Quantum metrology with photoelectrons. Volume 2, Applications and advances / Paul Hockett (National Research Council of Canada)

Von:

Hockett, Paul [VerfasserIn]

Resource type: Ressourcentyp: Buch (Online)Buch (Online)Sprache: Englisch Reihen: [IOP release 4] | IOP concise physicsGesamtaufnahme: Quantum metrology with photoelectrons.Verlag: San Rafael, CA, USA : Morgan & Claypool Publishers, [2018]Verlag: Bristol, UK : IOP Publishing, [2018]Copyright-Datum: © 2018Auflage: Version: 20180401Beschreibung: 1 Online-Ressource (verschiedene Seitenzählungen)ISBN:

9781681746883
9781681746906

Schlagwörter:

Andere physische Formen: 9781681746890 | Erscheint auch als: 9781681746890 Druck-AusgabeDDC-Klassifikation:

389.1 23

DOI: DOI: 10.1088/978-1-6817-4688-3Online-Ressourcen:

Zugang im Netz des KIT

Zusammenfassung: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.PPN: PPN: 1571826440Package identifier: Produktsigel: ZDB-135-IAL | ZDB-135-ICP

Exemplare ( 0 )

Dieser Titel hat keine Exemplare